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Materials Characterization

Materials Characterization                                                Contact: John Passero
                                                                                                                                                                               1-800-220-3675 ext. 3604
                                                                                                                                                                                      jpassero@EMSL.com


A vast array of processes and analytical techniques are used for materials analysis and characterization. The techniques required are dependent upon the material type, sample composition, condition, form and what information the client is looking for.

The ability of EMSL’s scientists and engineers to understand clients’ needs and objectives, coupled with our vast experience in this field, ensures your process and material objectives are understood. This allows us the ability to match the right technique and method to your specific project.

The following is a partial list of EMSL’s instrumentation and techniques that are available for materials analysis and characterization. 

Chemical Analysis

  • X-Ray Diffractometers (XRD)
  • X-ray Fluorescence Spectrometer (WD-XRF)
  • Fourier Transform Infrared Microscope; Micro FTIR (5 um spot resolution, reflected, transmitted, ATR, mapping, line profiles)
  • Gas Chromatographs (GC, ECD, FID, MS, MS/MS, NPD, High Resolution, Pyrolisis)
  • Carbon, Nitrogen, Sulfur, Hydrogen  Analyzers (combustion)
  • Inductively Coupled Plasma Spectrometer (ICP)
  • Inductively Coupled Plasma Spectrometer/ Mass Spectroscopy (ICP/MS)
  • Ion Chromatography (IC)
  • Liquid Chromatography–Mass Spectrometry (LC-MS)
  • Liquid Chromatography-Quadrupole Mass Spectrometer (LC-MS/MS)
  • High Performance Liquid Chromatography (HPLC)/Diode Array/Fluorescence Detectors
  • High Performance Liquid Chromatography coupled with ICP-MS (metals speciation)
  • Mercury Analyzer

 

Microscopy

 

·        Optical Microscopy: (RL, BF, DF, Transmitted polarized, DIC/NIC, Fluorescence)

·        Transmission Electron Microscopy: (HR-STEM) with energy-dispersive X-ray spectroscopy (EDS)

·        Scanning Electron Microscopy-EDS: (Mapping, high mag, quantification, line profiles, etc.)

·        Specialized Sample Preparation: FIB, Cryo-Microtome, etc.

 
Thermal Analysis

  • Differential Scanning Calorimeter (DSC)
  • Thermo Gravimetric Analysis (TGA)
  • Differential Thermal Analysis (DTA) 
  • Dynamic Mechanical Analysis (DMA)

 
Non-Destructive

  • Real Time Magnified X-Ray Imaging
  • High Resolution X-Ray Film Imaging
  • X-Ray CT (computational Tomography)
  • CSAM (Scanning Acoustic Microscopy)
  • Portable XRF (Niton type analyzer)
  • XRF (Plating thickness measurement)

 
Additional Testing Capabilities

  • EDM Machining
  • Cryo-Microtome
  • Environmental Chambers (various conditions)
  • Heat-Treating Furnaces (RT to 1700C)
  • Zeta Potential Analyzer
  • Additional Tests (offsite or special arrangement)
  • Dual Beam FIB (focused ion beam) – Tons of applications
  • EBSD/EBSD Mapping
  • Serial Block Tomography Imaging (3D reconstruction down to nm scale of volume w/EDS/EBSD compositional analysis)
  • Tensile Stage Real-Time Analysis of Strain/Compression in SEM
  • X-Ray Photoelectron Spectroscopy (XPS) 
  • TEM Sample Preparation and Lift Out
  • High Resolution TEM Analysis (200KV + and cryoTEM)
  • Surface Profile/3D Reconstruction
  • Micro Raman (small areas, diamonds, graphene, ceramics)
  • Atomic Force Microscopy (AFM) 

 

Full list of services provided for Materials Characterization ( click for details )
Laboratories providing Materials Characterization ( click for details )
Ann Arbor, MI (LAB 08) - NVLAP Lab Code 101048-4Atlanta, GA (LAB 07) - NVLAP Lab Code 101048-1Baton Rouge, LA (LAB 25) - NVLAP Lab Code 200375-0Beltsville, MD (LAB 19) - NVLAP Lab Code 200293-0Boston, MA (LAB 13) - NVLAP Lab Code 101147-0Buffalo, NY (LAB 14) - NVLAP Lab Code 200056-0Carle Place, NY (LAB 06) - NVLAP Lab Code 101048-10Charlotte, NC (LAB 41) - NVLAP Lab Code 200841-0Chicago, IL (LAB 26) - NVLAP Lab Code 200399-0Cinnaminson, NJ (LAB List in Description) - NVLAP Lab Code 101048-0Dallas, TX (LAB 11) - NVLAP Lab Code 600111-0Denver, CO (LAB 22) - NVLAP Lab Code 200828-0EMSL Canada - Calgary, AB (LAB 65) - NVLAP Lab Code 500100-0EMSL Canada - Montreal, QC (LAB 68) - NVLAP Lab Code 201052-0EMSL Canada - Ottawa, ON (LAB 67) - NVLAP Lab Code 201040-0EMSL Canada - Toronto, ON (LAB 55) - NVLAP Lab Code 200877-0EMSL Canada - Vancouver, BC (LAB 69) - NVLAP Lab Code 201068-0Fort Lauderdale, FL (LAB 56) - NVLAP Lab Code 500085-0Houston, TX (LAB 15) - NVLAP Lab Code 102106-0Huntington Beach, CA (LAB 33) - NVLAP Lab Code 101384-0Indianapolis, IN (LAB 16) - NVLAP Lab Code 200188-0Inland Empire (Ontario), CA (LAB 71) - NVLAP Lab Code 600239-0Jacksonville, FL (LAB 54) - NVLAP Lab Code 600265-0Kernersville, NC (LAB 02) - NVLAP Lab Code 102104-0Las Vegas, NV (LAB 31) - NVLAP Lab Code 600140-0Miami, FL (LAB 17) - NVLAP Lab Code 200204-0Minneapolis, MN (LAB 35) - NVLAP Lab Code 200019-0New York, NY (LAB 03) - NVLAP Lab Code 101048-9Orlando, FL (LAB 34) - NVLAP Lab Code 101151-0Phoenix, AZ (LAB 12) - NVLAP Lab Code 200811-0Piscataway, NJ (LAB 05) - NVLAP Lab Code 101048-2Plymouth Meeting, PA (LAB 18) - NVLAP Lab Code 200699-0Raleigh, NC (LAB 29) - NVLAP Lab Code 200671-0Rochester, NY (LAB 53) - NVLAP Lab Code 600183-0Salem, NH (LAB 23) - NVLAP Lab Code 201051-0San Diego, CA (LAB 43) - NVLAP Lab Code 200855-0San Leandro, CA (LAB 09) - NVLAP Lab Code 101048-3Seattle, WA (LAB 51) - NVLAP Lab Code 200613-0South Pasadena, CA (LAB 32) - NVLAP Lab Code 200232-0South Portland, ME (LAB 62) - NVLAP Lab Code 500094-0St. Louis, MO (LAB 39) - NVLAP Lab Code 200742-0Tampa, FL (LAB 93) - NVLAP Lab Code 600215-0Wallingford, CT (LAB 24) - NVLAP Lab Code 200700-0West Palm Beach, FL (LAB 57) - NVLAP Lab Code 600206-0
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